publications

1995

M. Labardi, M. Allegrini, F. Fuso, F. Leccabue, B.E. Watts, C. Ascoli and C. Frediani,"Scanning and Friction Force Microscopy (SFFM) of Ferroelectric Pb(Zr,Ti)O₃ Thin Films," Integrated Ferroelectric 8, 143 (1995).
M. Labardi, M. Allegrini, C. Ascoli, C. Frediani and M. Salerno "Normal and Lateral Force in Friction Force Microscopy," in NATO ASI Series E: Applied Sciences, Vol. 286, "Forces in Scanning Probe Methods," H.-J. Güntherodt, D. Anselmetti and E. Meyer Eds. (Kluwer Academic Publishers, Dordrecht, 1995), p. 319.
G. Attolini, C. Pelosi, S. Gennari, P.P. Lottici, F. Riccò, M. Allegrini, C. Frediani, M. Labardi, ''Raman Scattering in (111) Strained Heterostructures,'' Microel. J. 26, 797 (1995).
M. Labardi, F. Bassani, M. Allegrini, ''Use of Radiation Pressure on Microcantilevers to Measure the Optical Constants of Solids,'' on NATO-ASI series E: Applied Science, 300: ``Photons and Local Probes,'' edited by O. Marti, R. Möller (Kluwer Science Publisher, Dordrecht, 1995) p. 307.

1996

M. Labardi, M. Allegrini, E. Marchetti, P. Sgarzi, ''Scanning Force Microscopy of Polyolefinic Rubbers in Homopolypropylene Matrices,'' J. Vac. Sci. Technol. B 14, 1509 (1996).
T. Müller, T. Kässer, M. Labardi, M. Lux-Steiner, O. Marti, J. Mlynek, G. Krausch, ''Scanning Force and Friction Microscopy at Highly Oriented Polycrystalline Graphite and CuP₂ (100) Surfaces in Ultrahigh Vacuum,'' J. Vac. Sci. Technol. B 14, 1296 (1996).
M. Labardi, G.C. La Rocca, F. Mango, F. Bassani, M. Allegrini, ''Direct Measurement of Laser Momentum Transfer to Dense Media by means of Atomic Force Microscopy Cantilevers,'' J. Vac. Sci. Technol. B 14, 868 (1996).
S. Puccini, V. Pellegrini, M. Labardi, F. Fuso, M. Allegrini, A. Diligenti, A. Nannini, G. Pennelli, "Red and Blue-Light Emission from Free-Standing Porous Silicon,'' Nuovo Cimento D 18, 1149 (1996).
L. Ceresara, A. Iembo, F. Fuso, M. Labardi, M. Allegrini, E. Arimondo, A. Diodati, B.E. Watts, F. Leccabue, G. Bocelli, ''Pulsed Laser Ablation Deposition and Characterization of Superconductive/ Ferroelectric Bilayers,'' Superconductor Science and Technology 9, 671 (1996).
S. Gennari, G. Attolini, C. Pelosi, P.P. Lottici, F. Riccò, M. Labardi, M. Allegrini, C. Frediani, ''Raman Scattering Study and AFM Morphological Characterization of MOVPE-Grown (111)-Strained Heterostructures,'' J. Crystal Growth 166, 309 (1996).

1997

M. Labardi, P.G. Gucciardi, M. Allegrini, ``Force Gradient versus Distance Curves studied by Atomic Force Microscopy,'' in NATO-ASI series E: Applied Science, Vol. 330, ``Micro/ Nanotribology and its Applications,'' edited by B. Bhushan (Kluwer Scientific Publisher, Dordrecht, 1997), p. 129.
P.G. Gucciardi, M. Labardi, S. Gennai, F. Lazzeri, M. Allegrini, ''Versatile Scanning Near-Field Optical Microscope for Material Science Applications,'' Rev. Sci. Instrum. 68, 3088 (1997).

1998

M. Labardi, P.G. Gucciardi, M. Allegrini, C. Pelosi, ''Assessment of NSOM Resolution on III-V Semiconductor Thin Films,'' Appl. Phys. A 66, S397 (1998).
M. Labardi, ''Apparent and Actual Damping in Dynamic Force Spectroscopy,'' Probe Microscopy, in press.
M. Labardi, S. Gennari, G. Attolini, C. Pelosi, M. Allegrini, C. Frediani, P.P. Lottici, F. Riccò, ''Atomic Force Microscopy Characterization of (111) Oriented Heterostructures Grown by Metal-Organic Vapour Phase Epitaxy,'' Il Vuoto, in press.
M. Labardi, P.G. Gucciardi, M. Allegrini, ''Near Field Optical Microscopy'', La Rivista del Nuovo Cimento, invited paper, in preparation.